Application of Facial Implant Materials - "Tantalum Surface Treatment Improves Biohistological Response of Facial Implant Materials"

Figure 1 TEM cross-sectional image

After being modified by the tantalum ion implantation layer, tantalum was observed on the surface of the implanted material. In the TEM cross-sectional images (Figure 1), a tantalum implanted region with a thickness of 20–30 nm was clearly detected between the implant surface and the protective tantalum ion-implanted layer.

The tantalum-treated silicon implant material has a higher outer diameter. ODS of tantalum-treated and untreated siloxanes were 0.089 ± 0.034 and 0.062 ± 0.023, respectively, p-value = 0.4. Results were better than untreated silicone.

Table 1 Data summary

After implantation, all animals returned to normal. During the study period, none of the animals experienced death, swelling or discharge of pus at the implantation site. The soft tissue filling the gap between the implant and the skull was assessed in all specimens and the mean standard deviation was recorded. A comparison of the tantalum-treated and untreated implants showed that the tantalum-treated implant material had a higher amount of newly formed bone.

Figure 2 Growth of the implantation site